HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE STRUCTURE OF C-70 LANGMUIR-BLODGETT-FILM

Citation
Y. Xu et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE STRUCTURE OF C-70 LANGMUIR-BLODGETT-FILM, Solid state communications, 89(7), 1994, pp. 623-625
Citations number
12
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
89
Issue
7
Year of publication
1994
Pages
623 - 625
Database
ISI
SICI code
0038-1098(1994)89:7<623:HESOTS>2.0.ZU;2-V
Abstract
The Langmuir-Blodgett (LB) film of pure C70 was prepared from pure wat er subphase by horizontal lifting method. The limiting molecular area of C70 is around 25 A2, which suggests that the film formed at the air -water interface is rather bilayer or multilayer than a single monolay er in thickness. The structural features of C70 LB film were studied b y transmission electron microscopy. Regular lattice fringes, lattice d efects such as stacking faults, dislocations as well as amorphous-like disordered arrangements coexist in the film.