X-RAY-FLUORESCENCE ANALYSIS WITH ELEMENTS HAVING OVERLAPPED LINES

The overlapping of characteristic spectral lines of two or more elemen tal constituents of a sample has always been a drawback in x-ray fluor escence analysis. A new approach to solve this problem is presented, b ased in the excitation at two different energies. The results show tha t it is possible to calculate the concentration of elements with overl apped lines with high accuracy. We thus avoid the use of other means t o obtain the needed number of spectral lines, such as secondary charac teristic lines, which usually have a low peak to background ratio, or to recur to the line fraction (i.e. Kbeta/Kalpha), which is matrix dep endent.