M. Akizuki et al., IRRADIATION EFFECTS OF O-2 CLUSTER IONS FOR LEAD-OXIDE FILM FORMATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 121(1-4), 1997, pp. 166-169
O-2 cluster ions were directed onto Si substrates, covered with SiO2,
during the evaporation of Pb. By increasing the acceleration voltage,
the irradiation of O-2 cluster ions enhanced the oxidation, crystalliz
ation and surface smoothing oi. the polycrystalline lead oxide films.
They were preferentially oriented in the (111) direction at accelerati
on voltages above 5 kV, A significant smoothing effect was observed ev
en if the acceleration voltage was as low as 1 kV. A surface roughness
of 9 Angstrom was obtained at 7 kV.