IMAGING THE SURFACE OF SILICA MICROPARTICLES WITH THE ATOMIC-FORCE MICROSCOPE - A NOVEL SAMPLE PREPARATION METHOD

Authors
SHAKESHEFF KM DAVIES MC JACKSON DE ROBERTS CJ TENDLER SJB BROWN VA WATSON RC BARRETT DA SHAW PN
Citation
Km. Shakesheff et al., IMAGING THE SURFACE OF SILICA MICROPARTICLES WITH THE ATOMIC-FORCE MICROSCOPE - A NOVEL SAMPLE PREPARATION METHOD, Surface science, 304(1-2), 1994, pp. 120000393-120000399
Citations number
21
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
304
Issue
1-2
Year of publication
1994
Pages
120000393 - 120000399
Database
ISI
SICI code
0039-6028(1994)304:1-2<120000393:ITSOSM>2.0.ZU;2-Z
Abstract
High resolution AFM images of the surface topography of 5 mum diameter spherical silica particles have been obtained using the technique of partially embedding the particles in a thermoplastic adhesive. This no vel sample preparation method overcomes the problems of probe-induced particle movement during scanning and image broadening effects, and co uld facilitate the imaging by scanning probe microscopy techniques of other particulate or fibrous material.