The adsorption and thermal decomposition of diethylsilane on the Si(10
0)2 x 1 surface was studied using temperature programmed desorption ma
ss spectrometry and high resolution electron energy loss spectroscopy.
Diethylsilane dissociatively adsorbed to a saturation coverage of alm
ost-equal-to 0.25 ML. Adsorbate thermal decomposition produced ethylen
e and hydrogen which desorbed at 700 and 800 K, respectively. Hydrogen
desorption occurred exclusively from the 2 x 1 monohydride state. The
rmal decomposition proceeded by beta-hydride elimination which facilit
ated the clean removal of the ligand groups, resulting in a carbon-fre
e layer of silicon. An additional adsorption process, which eliminated
H-2 during the dissociative adsorption, occurred at surface defect si
tes.