To construct an all-silicon wavelength-tuneable infrared (IR) sensor b
y means of micromachining methods, not only the mechanical characteris
tics of silicon, but also the optical ones, must be considered. As pur
e silicon is transparent to a very high degree in the near-infrared re
gion (1.1-11 mu m), it is a common material for use in IR optical comp
onents like IR windows, IR lenses or IR prisms. This article will give
an overview on how the optical properties of the integrated IR sensor
depend on the materials used and technological process applied. In do
ing so, the theoretical limits and measured data will be compared; the
common ground and differences between them have been investigated and
will be discussed.