RESISTIVITY AND TEMPERATURE-COEFFICIENT OF RESISTIVITY OF THE FE ZR MULTILAYER FILMS/

Authors
LUCINSKI T STOBIECKI F
Citation
T. Lucinski et F. Stobiecki, RESISTIVITY AND TEMPERATURE-COEFFICIENT OF RESISTIVITY OF THE FE ZR MULTILAYER FILMS/, Acta Physica Polonica. A, 85(2), 1994, pp. 443-447
Citations number
7
Categorie Soggetti
Physics
Journal title
Acta Physica Polonica. A → ACNP
ISSN journal
05874246
Volume
85
Issue
2
Year of publication
1994
Pages
443 - 447
Database
ISI
SICI code
0587-4246(1994)85:2<443:RATORO>2.0.ZU;2-3
Abstract
The resistivity (rho) and temperature coefficient of resistivity (TCR) dependencies on modulation wavelength (lambda) were examined in Fe/Zr multilayer thin films. It was shown that the rho(lambda) and TCR(lamb da) behaviours can be explained on the basis of the assumption that th e amorphous phase can be spontaneously formed during the deposition pr ocess. We found that the effective thickness of the amorphous phase wa s almost-equal-to 2 nm per single interface.