DEVELOPMENTS IN APPLICATION OF HIGH-VOLTAGE ELECTRON-MICROSCOPE

Some applications of high voltage electron microscope (HVEM) at Hitach i are reviewed. Accompanied by the development of HVEM, applications f or many kinds of fields are studied. In the field of electron diffract ion, the critical voltage effect was observed for the first time. It h as been shown that the intensity of 222 reflection from aluminium beco me minimum at about 600 kV. In biological fields, higher resolution im ages of sectioned specimens can be obtained. Stereoscopic observation method of thick sectioned specimen (similar to 1 mu m) has been establ ished and some new information obtained. The possibility of observing living materials has also been investigated. A new environmental cell is developed, and wet specimens are observed. The irradiation effect o n a living material is also studied with spores. Electron microscope i mage within the fatal dose (2 x 10(-6) C/cm(2)) are too poor to obtain new information. In the materials science field, the coincidence rela tion of grain boundary in Fe alloy has been studied.