The small-angle x-ray intensities scattered (SAXS) by four reversed ph
ase silica (RPS) samples are analyzed. The RPS's have been obtained by
coating two different porous silica supports with dimethyloctyl- and
with dimethyloctadecyl-(chloro)silane. From the observed intensities i
t is possible to estimate the mean electron-densities of the films as
well as the mean silica-surface per coating molecule.