MULTIPLE-TRAPPING OF HYDROGEN IN ANTIMONY-DOPED SILICON

Citation
Zn. Liang et al., MULTIPLE-TRAPPING OF HYDROGEN IN ANTIMONY-DOPED SILICON, Physical review letters, 72(12), 1994, pp. 1846-1849
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
72
Issue
12
Year of publication
1994
Pages
1846 - 1849
Database
ISI
SICI code
0031-9007(1994)72:12<1846:MOHIAS>2.0.ZU;2-Q
Abstract
We have employed Mossbauer spectroscopy and low H implantation to stud y the Sb-H complexes in n-type Si. The different Mossbauer components were studied as a function of H dose, H-implantation temperature, and annealing temperature. To understand the observed data, it is necessar y to introduce, in addition to the well-known SbH complex, an SbH(n) c omplex (n greater-than-or-equal-to 2), which provides experimental evi dence for the existence of donor-multihydrogen complexes. We show that these complexes are in thermal equilibrium with a larger hydrogen res ervoir (H-2), which governs their thermal stability.