INDUCED REFRACTIVE ERRORS AND PATTERN ELECTRORETINOGRAMS AND PATTERN VISUAL-EVOKED POTENTIALS - IMPLICATIONS FOR CLINICAL ASSESSMENTS

Authors
Citation
Pr. Bartel et A. Vos, INDUCED REFRACTIVE ERRORS AND PATTERN ELECTRORETINOGRAMS AND PATTERN VISUAL-EVOKED POTENTIALS - IMPLICATIONS FOR CLINICAL ASSESSMENTS, Electroencephalography and clinical neurophysiology, 92(1), 1994, pp. 78-81
Citations number
16
Categorie Soggetti
Neurosciences
ISSN journal
00134694
Volume
92
Issue
1
Year of publication
1994
Pages
78 - 81
Database
ISI
SICI code
0013-4694(1994)92:1<78:IREAPE>2.0.ZU;2-A
Abstract
Refractive errors were induced in normal subjects by means of positive dioptre lenses to reduce visual acuity (VA) from an initial level of 20/20 to 20/100 and then to 20/200. Pattern electroretinograms (PERGs) and pattern visual evoked potentials (PVEPs) were simultaneously reco rded at each of these 3 levels of VA using high contrast checkerboard stimuli subtending 11' and 42' of visual are. Attention was paid to PE RG and PVEP variables used for clinical assessments. The findings conf irmed the need to take refractive errors into account because, in some cases, latencies and particularly PERG amplitudes fell outside normal limits with decreased VA, especially when using smaller checks.