Kpj. Williams et al., USE OF A RAPID-SCANNING STIGMATIC RAMAN IMAGING SPECTROGRAPH IN THE INDUSTRIAL-ENVIRONMENT, Journal of Raman spectroscopy, 25(1), 1994, pp. 131-138
Raman spectroscopy is steadily growing in importance in the industrial
analytical laboratory. The nature of the equipment, its ease of use a
nd its cost are making the method more acceptable to non-experts. This
paper illustrates the capabilities of a recent commercialized Raman s
ystem which fulfils the criteria of ease of use, speed and low cost. T
he system is designed for Raman microscopy and uses a single spectrogr
aph and CCD detector. The combination provides confocal microscopy, hi
gh throughput and optimum sensitivity, to the extent that it only requ
ires the use of a low-powered laser to provide high-quality spectral d
ata. The additional feature of direct Raman imaging is seen as being b
eneficial in the industrial environment in that it provides spatial in
formation over large surface areas quickly and without the need for ex
cessive amounts of data processing. The performance of the instrument
is illustrated with applications taken from the industrial environment
.