GIGAHERTZ MUX-DEMUX CHIP WITH HF BIST

Full functional test at speed, in-situ is an ideal choice for use for detection of errors in circuit behaviour for high speed broadband comm unication circuits and to avoid test set-up disturbances on high frequ ency signals. This article presents a novel technique to solve the hig h frequency test of Gbit/s data rate Time-Division Multiplexer/Demulti plexer circuits. This in-situ test technique is based on conventional pseudo-random sequence generation and signature analysis. By linear fe edback interconnect and reusable architecture the multiplexer/demultip lexer circuits can operate as generator/analyser with minimal degenera tion of bit shift rate. Circuit simulation showed that the system oper ates correctly with a clock frequency up to 3 GHz in a silicon bipolar technology with a current gain cut-off frequency f(T) = 15 GHz.