Langmuir-Blodgett bilayers of a polyglutamate (PG) statistical copolym
er have been investigated using atomic force microscopy (AFM) and X-ra
y reflectivity. PG ordered bilayer films on silicon surfaces possess a
n 'expanded' thickness of 4.12 +/- 0.05 nm and an average roughness of
0.7 +/- 0.2 nm. Possibilities for surface modification by the AFM tip
were explored. Formation of an 'abrasion'' surface morphology was rel
ated to a stick-slip mode of the AFM tip movement. Using the AFM tip,
several surface modifications were investigated: fabrication of large
(several hundreds of nanometers) and small (several nanometers) holes;
''writing'' of grooves of predictable geometry; fabrication of holes
of single layer and bilayer depth; cleaning of the surface and fabrica
tion of holes inside this new area. The anisotropic mechanical propert
ies of the PG bilayer were probed and attributed to orientation of the
PG backbones along the dipping direction. The dynamic behavior of the
surface changes were observed as well.