We propose a new method to determine the multi-affine fractal exponent
s based on a generalization of the roughness concept. For synthetic mu
lti-affine fractal profiles with exactly known exponents, we show that
the results obtained in this method are more accurate than the result
s obtained with the height-height correlation function method. Also in
the present method, scaling is observed using profiles with a number
of points more than one order of magnitude smaller.