THE MEASUREMENT OF ENHANCED L-AND-M X-RAY YIELDS FROM CHARGE-INDUCED STUDIES WITH PROTONS AND H-1(2)-BEAMS( ION)

Earlier work on Charge Induced X-rays (CHIX) was extended to include t he X-ray energy region between 0.70 to 4.0 keV. Protons of 700 keV, an d H-1(2)+ ion beams of equivalent proton energies in the range 350-450 keV were used to produce ''enhanced'' yields of L and M X-rays from a suitable selection of highly compacted non-conducting samples. ''Enha ncement'' factors are given and possible applications are mentioned.