FAST FOURIER TRANSFORMED ELECTRONIC SPECKLE CONTOURING FOR DIFFUSE SURFACES PROFILOMETRY

Authors
PAOLETTI D SPAGNOLO GS
Citation
D. Paoletti et Gs. Spagnolo, FAST FOURIER TRANSFORMED ELECTRONIC SPECKLE CONTOURING FOR DIFFUSE SURFACES PROFILOMETRY, Optics and lasers in engineering, 20(2), 1994, pp. 87-96
Citations number
14
Categorie Soggetti
Optics
Journal title
Optics and lasers in engineering → ACNP
ISSN journal
01438166
Volume
20
Issue
2
Year of publication
1994
Pages
87 - 96
Database
ISI
SICI code
0143-8166(1994)20:2<87:FFTESC>2.0.ZU;2-V
Abstract
A method of contouring three-dimensional objects using an out-of-plane sensitive ESPI apparatus with optical fibers is presented. The contou r map is obtained by shifting the object illumination beam. A Fourier transform method is suggested for automatic quantitative analysis of s pecklecorrelograms in terms of phase. An example of application is pre sented.