T. Wiell et al., LOCAL PROBING OF ADSORBATE ELECTRONIC-STRUCTURE USING SOFT-X-RAY EMISSION - ATOMIC NITROGEN ON NI(100) AND CU(100), Surface science, 304(3), 1994, pp. 120000451-120000455
The N 2p partial density of states of p4g-N/Ni(100) and c(2 x 2)-N/Cu(
100) overlayers have been studied by soft X-ray emission spectroscopy
(SXES) and comparisons with corresponding UV photoelectron spectra are
made. Broad states (approximately 10 eV) are observed due to the hybr
idisation between the N 2p and the substrate 3d and 4sp bands. For bot
h N/Cu and N/Ni the intensity stretches out to the Fermi level, where
a prominent peak for N/Cu is observed. These states close to the Fermi
level are interpreted as antibonding 2p-3d hybridised states. The hig
her occupancy of these states in N/Cu is expected due to the higher bi
nding energy of the 3d band in Cu than in Ni. For a complete interpret
ation of the SXE spectra, especially for N/Cu where many features are
observed, further theoretical studies are required.