THE ADHESION OF GROWING OXIDE SCALES TO THE SUBSTRATE

Citation
Gc. Wood et J. Stringer, THE ADHESION OF GROWING OXIDE SCALES TO THE SUBSTRATE, Journal de physique. IV, 3(C9), 1993, pp. 65-74
Citations number
34
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
3
Issue
C9
Year of publication
1993
Part
1
Pages
65 - 74
Database
ISI
SICI code
1155-4339(1993)3:C9<65:TAOGOS>2.0.ZU;2-M
Abstract
There is only limited new understanding of the structure of the evolvi ng dynamic metal/oxide interface itself but there is valuable circumst antial evidence from cooled specimens and from other interfaces. Ident ification of flaws for crack initiation, definition of a composite def ect and elaboration of delamination models, involving a plastically-re laxed crack tip region, have been undertaken. Loss of adhesion has rec eived more attention, by the alternatives of film buckling or crack pr opagation along the metal/oxide interface by wedging, including cases where stress relief occurs by creep. Mapping of scale failure modes ha s progressed. Computation and modelling using electronic and atomistic models are useful, but ''clean'' metal/oxide and contaminated interfa ces require in-depth work. Stress development and relaxation are compl ex. Models involve dislocation climb and the role of vacancy transport and cavity development. Sweeping of various particles by moving bound aries is receiving renewed analysis. The role of convoluted metal/oxid e interfaces in promoting or diminishing adhesion has been analysed qu antitatively. Explanation of reactive element effects by the embedded atom method is instructive, as are the relative roles of S and P in we akening interfacial adhesion.