IN-SITU EXAFS OBSERVATION OF THE MOLECULAR REACTION INTERMEDIATE FOR NO-H-2 REACTION ON HIGHLY-ACTIVE RH-SN SIO2 CATALYSTS/

Citation
K. Tomishige et al., IN-SITU EXAFS OBSERVATION OF THE MOLECULAR REACTION INTERMEDIATE FOR NO-H-2 REACTION ON HIGHLY-ACTIVE RH-SN SIO2 CATALYSTS/, Chemistry Letters, (2), 1994, pp. 235-238
Citations number
11
Categorie Soggetti
Chemistry
Journal title
ISSN journal
03667022
Issue
2
Year of publication
1994
Pages
235 - 238
Database
ISI
SICI code
0366-7022(1994):2<235:IEOOTM>2.0.ZU;2-I
Abstract
In - situ EXAFS technique was successful by applied for the first time to observe the molecular reaction intermediate for NO - H-2 reaction on highly active Rh - Sn/SiO2 catalysts. The EXAFS data, with. the aid of FTIR, revealed the existence the bent - type NO with the bond dist ance of 0.256 nm with Sn atoms (Rh - NO - Sn) on the bimetallic surfac e in the steady - state reaction conditions. The tilted NO was dissoci ated to form Sn - O bond at 0.205 nm.