EXPERIMENTAL INVESTIGATION OF FAR-FIELD DIFFRACTION BY MEANS OF NORMALLY AND NON-NORMALLY ILLUMINATED ELLIPTIC APERTURES OF WAVELENGTH DIMENSION

Authors
WANG YJ SCHOLL MS
Citation
Yj. Wang et Ms. Scholl, EXPERIMENTAL INVESTIGATION OF FAR-FIELD DIFFRACTION BY MEANS OF NORMALLY AND NON-NORMALLY ILLUMINATED ELLIPTIC APERTURES OF WAVELENGTH DIMENSION, Optical engineering, 33(3), 1994, pp. 692-696
Citations number
19
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
33
Issue
3
Year of publication
1994
Pages
692 - 696
Database
ISI
SICI code
0091-3286(1994)33:3<692:EIOFDB>2.0.ZU;2-Q
Abstract
Far-field diffraction resulting from elliptical apertures of different sizes is measured. Both normal and oblique angles of incidence on the apertures are investigated. Diffraction patterns from apertures with dimensions much greater than the wavelength agree with the existing th eory. However, new diffraction patterns have been found when using an aperture of wavelength dimension.