DIRECT STRUCTURAL DETERMINATION BY INVERSION OF EXPERIMENTAL DIFFUSE LOW-ENERGY-ELECTRON DIFFRACTION INTENSITIES

We demonstrate that two-dimensionally resolved diffuse low-energy elec tron diffraction intensities can be measured with sufficient accuracy and at multiple energies to allow direct inversion for a low coverage (5%) disordered K/Ni(100) surface. The data inversion reveals three-di mensional coordinates of atoms with atom images whose full width at ha lf maximum is less than 1 angstrom in all spatial directions. By varyi ng the angle of incidence, first layer and second layer near-neighbor Ni atoms are separately imaged. This is the first demonstration of mul tiple-energy internal-source electron holography using measured elasti cally backscattered electrons.