INVESTIGATION ON THE ADHESION OF POLYMER PARTICLES TO THE SURFACE OF A SEMICONDUCTOR

In this work the role of electrostatic forces in the adhesion of parti cles of dielectrics to a solid surface was studied. The experiment con sisted in measuring simultaneously the force of adhesion and the charg es of the electric double layer arising upon contact. The measurements were made with specially developed units-a pneumatic adhesiometer and a charge-spectrometer. The objects of study were polymer powders used in electrography, whose adhesion to thin layers of selenium samples w ere varied by varying the illumination and were estimated by their vol ume resistance in the dark and in the light. The shift in the Fermi le vel of the selenium caused by the change in the output work is accompa nied by a change in adhesion of the particles. Experiments on the sepa ration of polymer particles and films from selenium surface on illumin ation revealed spectral dependence of adhesion. In accordance with the electronic theory of adhesion, the effects observed may be attributed to the change in charge density of the electric double layer.