CRITICAL SCATTERING OF CONDUCTION ELECTRONS AROUND THE NEEL TEMPERATURE OF ALPHA-MANGANESE THIN-FILMS

Authors
BOAKYE F ADANU KG GRASSIE ADC
Citation
F. Boakye et al., CRITICAL SCATTERING OF CONDUCTION ELECTRONS AROUND THE NEEL TEMPERATURE OF ALPHA-MANGANESE THIN-FILMS, Materials letters, 18(5-6), 1994, pp. 320-326
Citations number
20
Categorie Soggetti
Material Science","Physics, Applied
Journal title
Materials letters → ACNP
ISSN journal
0167577X
Volume
18
Issue
5-6
Year of publication
1994
Pages
320 - 326
Database
ISI
SICI code
0167-577X(1994)18:5-6<320:CSOCEA>2.0.ZU;2-F
Abstract
The critical scattering of conduction electrons in the neighbourhood o f the Neel temperature of Mn thin films has been studied using our res istivity-temperature curves. The Neel temperature of alpha-Mn thin fil ms has been established as 90 +/- 1 K and an analysis of the resistivi ty results near the Neel temperature gave critical exponents which are in moderate agreement with existing theories.