A MATHEMATICAL-MODEL FOR PLANARIZATION OF MICROELECTRONIC TOPOGRAPHIES

Citation
Rk. Yonkoski et Ds. Soane, A MATHEMATICAL-MODEL FOR PLANARIZATION OF MICROELECTRONIC TOPOGRAPHIES, Journal of the Electrochemical Society, 141(2), 1994, pp. 585-592
Citations number
31
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
141
Issue
2
Year of publication
1994
Pages
585 - 592
Database
ISI
SICI code
0013-4651(1994)141:2<585:AMFPOM>2.0.ZU;2-F
Abstract
A model has been developed to predict free surface profiles over topog raphic features for nonvolatile fluids. The degree of planarity of the free surface is shown to depend on two geometric ratios and the relat ive magnitude of centrifugal and surface tension forces. Previous mode ls have used a lubrication model to approximate the flow field. One pu rpose of this work is to make a comparison between the full two-dimens ional model and a one-dimensional lubrication model. The lubrication m odel compares favorably to the 2D model for large features. For small features, there is a difference between the free surface predictions o f the two models, which depend on the geometric ratios.