Rk. Yonkoski et Ds. Soane, A MATHEMATICAL-MODEL FOR PLANARIZATION OF MICROELECTRONIC TOPOGRAPHIES, Journal of the Electrochemical Society, 141(2), 1994, pp. 585-592
A model has been developed to predict free surface profiles over topog
raphic features for nonvolatile fluids. The degree of planarity of the
free surface is shown to depend on two geometric ratios and the relat
ive magnitude of centrifugal and surface tension forces. Previous mode
ls have used a lubrication model to approximate the flow field. One pu
rpose of this work is to make a comparison between the full two-dimens
ional model and a one-dimensional lubrication model. The lubrication m
odel compares favorably to the 2D model for large features. For small
features, there is a difference between the free surface predictions o
f the two models, which depend on the geometric ratios.