X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES ON PYROLYSIS OF THIN-FILMS OF PLASMA-POLYMERIZED ACRYLONITRILE

Citation
Ah. Bhuiyan et al., X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES ON PYROLYSIS OF THIN-FILMS OF PLASMA-POLYMERIZED ACRYLONITRILE, Thin solid films, 240(1-2), 1994, pp. 66-69
Citations number
23
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
240
Issue
1-2
Year of publication
1994
Pages
66 - 69
Database
ISI
SICI code
0040-6090(1994)240:1-2<66:XPSSOP>2.0.ZU;2-9
Abstract
X-Ray photoelectron spectroscopy is used to elucidate the chemical env ironments of the atoms in as-deposited plasma-polymerized acrylonitril e (PPAN) thin film and PPAN films pyrolysed at the temperatures 573 an d 773 K. The photoelectron spectra are collected at the electron take- off angles of 20-degrees and 70-degrees. The C 1s, N 1s, and O 1s spec tra of all the samples demonstrate clearly that the structural modific ations take place owing to pyrolysis in the PPAN structure. Apart from the structural modifications, a decrease of nitrogen and an uptake of oxygen are evidenced. A few chemical species other than the usual one s are also detected.