Ee. Khawaja et al., STUDY OF THE LORENTZ-LORENZ LAW AND THE ENERGY-LOSS OF HE-4 IONS IN TITANIUM-OXIDE FILMS, Thin solid films, 240(1-2), 1994, pp. 121-130
The optical constants, thicknesses and densities of thin titanium oxid
e films, deposited by electron beam evaporation, were measured. The va
riation of the refractive index with the density, of titanium oxide sa
mples in the form of thin films (present work) and bulk crystalline fo
rm (data from the literature), was observed to follow the Lorentz-Lore
nz law. The molecular electronic polarizability deduced from the law w
as close (within the uncertainty in the measurement) to the value repo
rted in the literature. Rutherford backscattering spectroscopy and X-r
ay photoelectron spectroscopy studies were carried out on the thin fil
ms.