Gs. Frankel et al., X-RAY-ABSORPTION STUDY OF ELECTROCHEMICALLY GROWN OXIDE-FILMS ON ALCRSPUTTERED ALLOYS, Journal of the Electrochemical Society, 141(1), 1994, pp. 83-90
The chemistry of chromium in the passive film on sputter-deposited chr
omium and AlCr thin films has been investigated in situ in an electroc
hemical cell under potential control by studying x-ray absorption near
edge structure. At high potentials, Cr in the AlCr alloys was oxidize
d to the 6-valent state. Depending on the rate of potential increase,
6-valent chromium either dissolved from the alloy or was trapped in th
e passive film where it was electroactive, i.e., the valence state cou
ld be reversibly switched between the 3- and 6-valent states by changi
ng the applied potential. The kinetics of these processes were investi
gated. Ex situ x-ray photoelectron spectroscopy measurements indicated
that, during slow scanning at low potentials, the composition of both
the surface oxide and underlying metallic layers changed. These chang
es resulted in a structure that was susceptible to transpassive dissol
ution of Cr at potentials above 0.2 V(MSE).