A CHAMBER FOR THE IN-SITU IR MEASUREMENT OF C60 THIN-FILMS WHILE DOPING WITH ALKALI-METALS

Authors
KOLLER D MARTIN MC STEPHENS PW MIHALY L
Citation
D. Koller et al., A CHAMBER FOR THE IN-SITU IR MEASUREMENT OF C60 THIN-FILMS WHILE DOPING WITH ALKALI-METALS, Review of scientific instruments, 65(3), 1994, pp. 760-761
Citations number
7
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
65
Issue
3
Year of publication
1994
Pages
760 - 761
Database
ISI
SICI code
0034-6748(1994)65:3<760:ACFTII>2.0.ZU;2-I
Abstract
A sample chamber has been designed to simultaneously measure the DC re sistivity and IR transmission of C60 thin films while the films are do ped with alkali metals in-situ. The chamber construction allows a choi ce of windows to cover the entire IR and visible range, while x-ray di ffraction studies are also possible to determine the sample stoichiome try.