DYNAMIC HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DIFFUSION BONDING BETWEEN ZINC-OXIDE NANOCRYSTALLITES AT AMBIENT-TEMPERATURE

Authors
Citation
T. Kizuka et N. Tanaka, DYNAMIC HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DIFFUSION BONDING BETWEEN ZINC-OXIDE NANOCRYSTALLITES AT AMBIENT-TEMPERATURE, Philosophical magazine letters, 69(3), 1994, pp. 135-139
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09500839
Volume
69
Issue
3
Year of publication
1994
Pages
135 - 139
Database
ISI
SICI code
0950-0839(1994)69:3<135:DHEODB>2.0.ZU;2-D
Abstract
The process of diffusion bonding between nanometre-sized zinc oxide cr ystallites in vacuum-deposited films is observed dynamically at atomic resolution by transmission electron microscopy for the first time. It is found that the nanocrystallites, having clean surfaces, bond witho ut any solders at ambient temperature, and that neck growth proceeds i nstantly after contact under electron irradiation.