LOW-LOSS MICROWAVE CAVITY USING LAYERED-DIELECTRIC MATERIALS

Citation
Cj. Maggiore et al., LOW-LOSS MICROWAVE CAVITY USING LAYERED-DIELECTRIC MATERIALS, Applied physics letters, 64(11), 1994, pp. 1451-1453
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
11
Year of publication
1994
Pages
1451 - 1453
Database
ISI
SICI code
0003-6951(1994)64:11<1451:LMCULM>2.0.ZU;2-7
Abstract
Loss measurements have been carried out on a cylindrical pillbox cavit y whose metallic flat end walls have been replaced by an ordered seque nce of high purity sapphire and air dielectric layers. The loss of the TE01 mode at 18.99 GHz was substantially lowered. An improvement in c avity Q for this mode from 8.30 X 10(3) to 531 X 10(30 was observed. T hese experimental results closely reproduce two independent theoretica l simulations. All measurements were taken at 30-degrees-C.