CRITICAL ISSUES CONCERNING THE MECHANISMS OF DUPLEX GRAIN-STRUCTURE FORMATION AND INTERPRETATION OF DUPLEX NIO GROWN ON PURE NI AND CR DOPED SUBSTRATES DURING HIGH-TEMPERATURE OXIDATION
Ck. Kim et Lw. Hobbs, CRITICAL ISSUES CONCERNING THE MECHANISMS OF DUPLEX GRAIN-STRUCTURE FORMATION AND INTERPRETATION OF DUPLEX NIO GROWN ON PURE NI AND CR DOPED SUBSTRATES DURING HIGH-TEMPERATURE OXIDATION, Journal of materials engineering and performance, 5(6), 1996, pp. 699-709
Duplex layers are a very important class of film microstructures and f
orm under a wide variety of conditions on a large number of substrates
. In this paper, the available models for duplex layer formation are r
eviewed in detail and the basic assumptions which are based upon them
are examined. The mechanisms of formation of the duplex layers based o
n microstructural observations in pure Ni and Ni-lat. % Cr systems dur
ing high-temperature oxidation are addressed.