BACK-FACE STRAIN COMPLIANCE AND ELECTRICAL-POTENTIAL CRACK LENGTH CALIBRATIONS FOR THE DISK-SHAPED COMPACT-TENSION DC(T) SPECIMEN

Authors
GILBERT CJ MCNANEY JM DAUSKARDT RH RITCHIE RO
Citation
Cj. Gilbert et al., BACK-FACE STRAIN COMPLIANCE AND ELECTRICAL-POTENTIAL CRACK LENGTH CALIBRATIONS FOR THE DISK-SHAPED COMPACT-TENSION DC(T) SPECIMEN, Journal of testing and evaluation, 22(2), 1994, pp. 117-120
Citations number
16
Categorie Soggetti
Materials Science, Characterization & Testing
Journal title
Journal of testing and evaluation → ACNP
ISSN journal
00903973
Volume
22
Issue
2
Year of publication
1994
Pages
117 - 120
Database
ISI
SICI code
0090-3973(1994)22:2<117:BSCAEC>2.0.ZU;2-G
Abstract
Back-face strain compliance and electrical-potential crack length cali brations have been experimentally determined for the disk-shaped compa ct-tension DC(T) specimen. Finite-element modeling was used to ascerta in the back-face strain distribution at several crack lengths to deter mine the significance of inconsistent gage placement. The numerical so lutions demonstrated good agreement with experiment, especially at sma ller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the cr ack tip closely approaches the back of the test specimen.