GLANCING ANGLE X-RAY-DIFFRACTION - A DIFFERENT APPROACH

This letter describes a novel technique of diffracted beam glancing an gle x-ray diffraction by which depth profiles of stresses and transfor med phases in structures like implanted materials can be determined. A n important feature is that this method may be applied successfully in a standard powder diffractometer. It is shown that, beside the well-k nown incident beam glancing angle method which usually requires rather sophisticated equipment with parallel beam optics combined with more intense x-ray sources, diffracted beam glancing angle x-ray diffractio n can be applied as well.