Ji. Song et al., GAINP GAAS DOUBLE-HETEROJUNCTION BIPOLAR-TRANSISTOR WITH HIGH F(T), F(MAX), AND BREAKDOWN VOLTAGE/, IEEE electron device letters, 15(1), 1994, pp. 10-12
We report on the dc and microwave performance of an MOCVD-grown carbon
-doped GaInP/GaAs double heterojunction bipolar transistor (DHBT) with
a thin highly doped n-type GaInP layer in the collector. The DHBT sho
wed improved current-voltage characteristics at low collector-emitter
bias compared with those of a DHBT without the heavily doped GaInP lay
er, while maintaining a high breakdown voltage (BV(CEO) approximately
20 V). Small area, self-aligned emitter transistors with two 2 x 5 mum
2 emitter fingers were fabricated and exhibited f(T) and f(max) of 53
GHz and 75 GHz, respectively. These results indicate the promise of ca
rbon-doped base GaInP/CaAs DHBT's for high-power microwave application
s.