We have investigated the elastic effects of hydrogen loading on thin f
ilms of niobium. it has been shown recently [1] that epitaxial Nb film
s grown with MBE on sapphire substrates exhibit a one-dimensional expa
nsion, perpendicular to the film surface, on loading with hydrogen, up
to a critical hydrogen concentration. This can be understood as an ep
itaxial clamping of the metal film by the substrate. We report the fir
st-direct measurement of the relation between out-of-plane expansion a
nd hydrogen concentration in these films. Nb [110] films were loaded w
ith H from the gas phase below the critical concentration. The lattice
parameters were measured absolutely with a three-crystal high-resolut
ion X-ray diffractometer. H concentrations were measured and depth-pro
filed directly using the nuclear reaction H-1(N-15,alphagamma)C-12. Th
e resulting lattice expansion as a function of H concentration is foun
d to be nearly four times larger than expected from bulk values of the
elastic constants. The hydrogen depth profiles also show a H concentr
ation gradient extending well beyond the immediate surface region.