The use of epitaxial GaAs:Bi films doped with isovalent impurities ens
ured much better electrical characteristics of fast-response photodiod
e structures of the metal-semiconductor-metal type made from these fil
ms. In particular, the density of the dark current was lower, the coef
ficient representing the deviation of the current-voltage characterist
ics from the ''ideal'' behavior was smaller, and the avalanche breakdo
wn voltage was higher. The use of such structures in various optoelect
ronic devices can improve their noise characteristics.