METAL-SEMICONDUCTOR-METAL PHOTODIODE STRUCTURES WITH A LOW DARK CURRENT-DENSITY

Citation
Sv. Averin et al., METAL-SEMICONDUCTOR-METAL PHOTODIODE STRUCTURES WITH A LOW DARK CURRENT-DENSITY, Semiconductors, 27(11-12), 1993, pp. 996-998
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
27
Issue
11-12
Year of publication
1993
Pages
996 - 998
Database
ISI
SICI code
1063-7826(1993)27:11-12<996:MPSWAL>2.0.ZU;2-C
Abstract
The use of epitaxial GaAs:Bi films doped with isovalent impurities ens ured much better electrical characteristics of fast-response photodiod e structures of the metal-semiconductor-metal type made from these fil ms. In particular, the density of the dark current was lower, the coef ficient representing the deviation of the current-voltage characterist ics from the ''ideal'' behavior was smaller, and the avalanche breakdo wn voltage was higher. The use of such structures in various optoelect ronic devices can improve their noise characteristics.