INFLUENCE OF STRUCTURE CHARACTERISTICS OF EPITAXIAL CDXHG1-XTE FILMS ON ELECTRICAL AND PHOTOELECTRIC PROPERTIES AFTER LASER IRRADIATION

Citation
Pe. Mozol et al., INFLUENCE OF STRUCTURE CHARACTERISTICS OF EPITAXIAL CDXHG1-XTE FILMS ON ELECTRICAL AND PHOTOELECTRIC PROPERTIES AFTER LASER IRRADIATION, Semiconductors, 27(11-12), 1993, pp. 1002-1007
Citations number
16
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
27
Issue
11-12
Year of publication
1993
Pages
1002 - 1007
Database
ISI
SICI code
1063-7826(1993)27:11-12<1002:IOSCOE>2.0.ZU;2-N
Abstract
A comprehensive investigation was made of photoelectric and electrical properties of epitaxial CdxHg1-xTe films with a cellular structure, w hich were irradiated with nanosecond ruby laser pulses characterized b y a wide range of energy densities. An increase in the photosensitivit y of the investigated samples was attributed to the gettering of elect rically active point defects by regions of weak misorientation. Change s in the electrical properties were due to a reduction in the number o f mercury atoms at interstices because of laser-stimulated desorption and segregation of mercury at sinks, and also because of changes in th e electron states at the boundaries of cells. Treatment of epitaxial f ilms with laser pulses characterized by an energy density above the me lting threshold increased the band gap in the surface layers and this was due to residual stresses and composition changes in these layers.