PRECISION SEMICONDUCTOR SPECTROMETRY OF IONS

Citation
Em. Verbitskaya et al., PRECISION SEMICONDUCTOR SPECTROMETRY OF IONS, Semiconductors, 27(11-12), 1993, pp. 1127-1136
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
27
Issue
11-12
Year of publication
1993
Pages
1127 - 1136
Database
ISI
SICI code
1063-7826(1993)27:11-12<1127:PSSOI>2.0.ZU;2-H
Abstract
Some aspects of high-precision determination of the energy of nuclear particles with use of semiconductor detectors are analyzed. The main d ifficulties are shown to be related to suppression of nonequilibrium c arrier capture. Transport of these carriers is slowed down by nonlinea r effects due to a high density of carriers in the particle tracks. Th e carrier generation occurs near the surface. It is shown that control of the built-in field in p+-n detectors can minimize the recombinatio n processes. High-purity Si detectors, therefore, have an accuracy lev el which is limited only by fundamental factors.