E. Squireswheeler et al., PERSONALITY FEATURES AND DISORDER IN THE SUBJECTS IN THE NEW-YORK HIGH-RISK PROJECT, Journal of Psychiatric Research, 27(4), 1993, pp. 379-393
One hundred and seventy-five offspring of parents in two psychiatrical
ly ill groups and of normal controls in the New York High-Risk Project
(NYHRP) were assessed for Axis II personality traits and disorders as
defined by the Diagnostic and Statistical Manual of Mental Disorders,
Third Edition, Revised (DSM-III-R). These offspring include: subjects
at high risk for schizophrenia (HRSz, n = 48), all of whom have a par
ent with schizophrenic disorder; subjects at high risk for affective d
isorder (HRAff, n = 40), all of whom have a parent with affective diso
rder; and subjects at no increased risk for psychiatric illness (NC, n
= 87), whose parents are psychiatrically normal. The trained intervie
wers, who administered a standardized direct interview, were blind to
parental clinical status and to previous clinical of the offspring. Th
e rates for any personality disorder (PD) ranged from 7% to 20%. Comor
bidity between Axis I and Axis II disorders was high for all groups.