D. Vanmaekelbergh et Pc. Searson, ON THE ELECTRICAL-IMPEDANCE DUE TO THE ANODIC-DISSOLUTION OF SILICON IN HF SOLUTIONS, Journal of the Electrochemical Society, 141(3), 1994, pp. 697-702
The electrical impedance measured at p-type and highly doped n-type Si
electrodes in HF solutions in the potential range of pore formation h
as been interpreted using a basic model. This model includes two elect
rochemical reactions (hole capture and electron injection) followed by
a chemical oxidation reaction, and accounts for the main results repo
rted in the literature. The electrical impedance has been calculated f
or the anodic dissolution proceeding both under depletion-layer and He
lmholtz-layer control. It has been concluded that the impedance and, i
n particular, the inductive loop measured in the onset region of the a
nodic dissolution can be explained fairly well on the basis of the mod
el and assuming depletion layer control. The inductive loop is ascribe
d to electron injection from a surface intermediate of the dissolution
process into the conduction band.