CHEMICAL BATH DEPOSITION OF ZNSE AND CUSE THIN-FILMS USING N,N-DIMETHYLSELENOUREA

Citation
Ca. Estrada et al., CHEMICAL BATH DEPOSITION OF ZNSE AND CUSE THIN-FILMS USING N,N-DIMETHYLSELENOUREA, Journal of the Electrochemical Society, 141(3), 1994, pp. 802-806
Citations number
25
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
141
Issue
3
Year of publication
1994
Pages
802 - 806
Database
ISI
SICI code
0013-4651(1994)141:3<802:CBDOZA>2.0.ZU;2-P
Abstract
Chemical bath deposition techniques for ZnSe and CuSe thin films using N,N-dimethylselenourea as the source of selenide ion are presented. F ilms of O.1 to 0.3 mum in thickness of ZnSe and CuSe are obtained in 2 to 10 h depositions at 50-degrees-C. The ZnSe films possess optical b andgap approximately 2.63 eV and suffer thermal degradation at tempera tures >350-degrees-C. They are very resistive, with sheet resistance a pproximately 10(12) OMEGA/square (approximately 0.3 mum film, 10 h dep osition). The CuSe films have sheet resistance approximately 10(3) OME GA/SQUARE (approximately 0.13 mum, 3 h deposition) but undergo thermal degradation at temperatures >200-degrees-C. Structure, composition, o ptical, and electrical characteristics of the films are discussed.