CLUSTERING OF OXYGEN-ATOMS IN SILICON AT 450-DEGREES-C - A NEW APPROACH TO THERMAL DONOR FORMATION

Citation
Jl. Lindstrom et T. Hallberg, CLUSTERING OF OXYGEN-ATOMS IN SILICON AT 450-DEGREES-C - A NEW APPROACH TO THERMAL DONOR FORMATION, Physical review letters, 72(17), 1994, pp. 2729-2732
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
72
Issue
17
Year of publication
1994
Pages
2729 - 2732
Database
ISI
SICI code
0031-9007(1994)72:17<2729:COOISA>2.0.ZU;2-E
Abstract
Clustering of oxygen atoms in silicon at 450-degrees-C has been correl ated with a group of infrared vibrational absorption bands observable at room temperature. The bands are related to the formation of thermal donors and show a good correlation with results from different experi mental techniques. It is suggested that three categories of thermal do nors are developing corresponding to absorption bands at about 975, 98 8, 1000, 1006, and 1012 cm-1.