T. Dellorto et al., INTERNAL PHOTOEMISSION-STUDIES OF ARTIFICIAL BAND DISCONTINUITIES AT BURIED GAAS(100) GAAS(100) HOMOJUNCTIONS, Applied physics letters, 64(16), 1994, pp. 2111-2113
Internal photoemission phototransport measurements revealed 0.27+/-0.0
4 eV conduction- and valence-band discontinuities induced by a Si intr
alayer at p-GaAs(100)/n-GaAs(100) homojunctions. The interface dipole
originating from the heterovalent character of the Si-GaAs bonds raise
s the bands of the GaAs overlayer above that of the GaAs subtrate.