ON THE DEPOSITION OF THIN TIO2 FILMS FROM LANGMUIR-BLODGETT-FILM PRECURSORS - AN ELECTRON-SPECTROSCOPY STUDY

X-Ray photoemission and reflection electron energy loss spectroscopies have been used to characterize ultrathin TiO2 films obtained by therm al decomposition of Langmuir Blodgett films of n-octadecyl amine which were used to pick up titanyl oxalate ions from the aqueous subphase. The dielectric function of the film was obtained by a Kramers-Kronig a nalysis of the electron energy loss spectra, which show features chara cteristic of TiO2. A detailed Tougaard analysis of the photoemission c ore level background signal was performed to obtain the composition de pth profile of the various elements and make an estimate of the film t hickness.