STRUCTURAL-ANALYSIS OF 70GEO230BI2O3 GLASS BY X-RAY-DIFFRACTION

Authors
WASEDA Y SUGIYAMA K SUNAMORI Y OMOTE K ASHIZUKA M
Citation
Y. Waseda et al., STRUCTURAL-ANALYSIS OF 70GEO230BI2O3 GLASS BY X-RAY-DIFFRACTION, Science Reports of the Research Institutes, Tohoku University, Series A: Physics, Chemistry, and Metallurgy, 39(2), 1994, pp. 175-182
Citations number
21
Categorie Soggetti
Material Science","Metallurgy & Mining
Journal title
Science Reports of the Research Institutes, Tohoku University, Series A: Physics, Chemistry, and Metallurgy → ACNP
ISSN journal
00408808
Volume
39
Issue
2
Year of publication
1994
Pages
175 - 182
Database
ISI
SICI code
0040-8808(1994)39:2<175:SO7GBX>2.0.ZU;2-U
Abstract
The anomalous X-ray scattering (AXS) technique has been applied to obt ain the environmental RDFs around germanium and bismuth in glassy 70Ge O230Bi2O3 from differential intensities measured at the Ge K and Bi L( III) absorption edges using synchrotron radiation. The analysis of the RDFs shows that environmental structure around germanium and bismuth is quite similar to that in Bi4Ge3O12 crystal. EXAFS analysis is also made in order to confirm the local coordination number of oxygen aroun d the constituent cations. Then, the structural model of glassy 70GeO2 30Bi2O3 Was proposed by reproducing the intensity variation measured a t Ge K and Bi L(III) edges, including the ordinary interference functi on.