Sd. Bystrov et al., RELATIONSHIP BETWEEN GROWTH-CONDITIONS AND HETEROJUNCTION QUALITY IN INP IN1-XGAXAS SELECTIVELY DOPED HETEROSTRUCTURES GROWN BY LIQUID-PHASE EPITAXY/, Semiconductors, 28(2), 1994, pp. 180-182
The changes in the state of the heterojunction in InP/In1-xGaxAs selec
tively doped heterostructures with a 2D electron gas, grown by liquid-
phase epitaxy, have been studied at various epitaxy temperatures T(ep)
for the layers of the In1-xGaAs solid solution. Even a very slight de
viation from the optimum epitaxy temperature T(ep) results in a decre
ase in the carrier mobility of the 2D electron gas. This decrease is d
ue to a degradation of the quality of the heterojunction, probably thr
ough an increase in the concentration of charged defects and roughness
.