SIMS-RBS DEPTH PROFILING OF SILVER-DIFFUSED GLASS SYSTEMS

Authors
QUARANTA A GONELLA F CACCAVALE FC BRUSATIN G
Citation
A. Quaranta et al., SIMS-RBS DEPTH PROFILING OF SILVER-DIFFUSED GLASS SYSTEMS, Surface and interface analysis, 21(3), 1994, pp. 210-212
Citations number
9
Categorie Soggetti
Chemistry Physical
Journal title
Surface and interface analysis → ACNP
ISSN journal
01422421
Volume
21
Issue
3
Year of publication
1994
Pages
210 - 212
Database
ISI
SICI code
0142-2421(1994)21:3<210:SDPOSG>2.0.ZU;2-R
Abstract
Both SIMS and RBS techniques are used to obtain smooth accurate concen tration profiles of silver diffused into soda-lime glass systems. By a computer simulation, a combination of the two techniques enables more detailed information to be obtained on the silver distribution at a d epth of up to several micrometres, and the concentration profiles can be used effectively for testing the reliability of some optical behavi our characterizations of glass waveguiding structures.