REDUCTION IN THE ELECTRON-RADIATION DOSE STRENGTH FOR LAYERS OF CHARGED DIELECTRICS

Citation
Vv. Tsetlin et al., REDUCTION IN THE ELECTRON-RADIATION DOSE STRENGTH FOR LAYERS OF CHARGED DIELECTRICS, High energy chemistry, 27(5), 1993, pp. 391-395
Citations number
16
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00181439
Volume
27
Issue
5
Year of publication
1993
Pages
391 - 395
Database
ISI
SICI code
0018-1439(1993)27:5<391:RITEDS>2.0.ZU;2-4
Abstract
It has been found that during irradiation of high-resistivity inorgani c glasses capable of being radiation charged, there is a reduction in the dose intensity underneath the material. For thin glass samples, th e reduction in dosage is not substantial, however for sample thickness es of approximately 0.8 of the electron range, the dosage is no more t han 15% of its initial value. For thick samples which completely absor b the beam, the dosage from Bremsstrahlung radiation drops to 0.7-0.8 of the initial level. Calculations indicate that the electric field of the space charge after the dosage not only underneath the irradiated layer, but inside it as well.