Vv. Tsetlin et al., REDUCTION IN THE ELECTRON-RADIATION DOSE STRENGTH FOR LAYERS OF CHARGED DIELECTRICS, High energy chemistry, 27(5), 1993, pp. 391-395
It has been found that during irradiation of high-resistivity inorgani
c glasses capable of being radiation charged, there is a reduction in
the dose intensity underneath the material. For thin glass samples, th
e reduction in dosage is not substantial, however for sample thickness
es of approximately 0.8 of the electron range, the dosage is no more t
han 15% of its initial value. For thick samples which completely absor
b the beam, the dosage from Bremsstrahlung radiation drops to 0.7-0.8
of the initial level. Calculations indicate that the electric field of
the space charge after the dosage not only underneath the irradiated
layer, but inside it as well.