Yy. Su et M. Marek, CATHODIC REDUCTION OF OXIDES FORMED ON COPPER AT ELEVATED-TEMPERATURES, Journal of the Electrochemical Society, 141(4), 1994, pp. 940-942
Cathodic stripping is used to determine the oxide thickness on copper.
For copper oxidized at elevated temperatures the potential-time curve
at constant cathodic current density features two distinct regions, c
orresponding to the reduction of two different oxides. The sequence in
which the oxides are reduced at constant current density has been exa
mined here using potential-time measurements and electron spectroscopy
for chemical analysis. The results show that the top layer of cupric
oxide, if continuous, is cathodically reduced first at a higher potent
ial, followed by reduction of the inner layer of cuprous oxide at a lo
wer potential. This conclusion is at variance with a reduction model u
sed in measurements of the oxide thickness in the industry and accepte
d as part of a standard specification.